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Introduction

Here you will find articles and documentation (available categories are listed below) related to Self-Monitoring, Analysis and Reporting Technology (S.M.A.R.T.)


Manufacturers
Microsoft
Specifications
Wikipedia
UCSD SMART Project
Other articles

Manufacturers

Samsung

Introduction to S.M.A.R.T.


Seagate

Enhanced Drive Self-Test
Get S.M.A.R.T. for Reliability
Playing it S.M.A.R.T. ( HTML version)


Western Digital

Thermal Monitoring for Advanced Data Protection

Specifications

Small Form Factor (SFF) Committee specifications

SFF-8035i (v 2.0)
SFF-8035i (v 1.0)
SFF-8055i (Guide for the ATA and SCSI interfaces)


Technical Committee (T13) specifications

ATA-3 specification
ATAPI/ATA-4 specification
ATAPI/ATA-5 specification
ATAPI/ATA-6 specification
The ATAPI/ATA-7 specification: Part 1 | Part 2 | Part 3

Proposals from the Technical Committee T13 are listed here.

Wikipedia

Wikipedia

Deutsch
English
Español
Français
Italiano
Japanese
Nederlands
Polski
Português
Russian
Slovenčina
Svenska

UCSD

UCSD SMART Project

Bayesian approaches to failure prediction for disk drives
Improved Disk Drive Failure Warnings
Page designed by Erik Arvidsson & Emil A Eklund.
Maintained by Zbigniew Chlondowski.